QualificationsPh.D., University of Michigan, Electrical Engineering, 1996. M.S., University of Michigan, Electrical Engineering, 1993. B.S., University of Minnesota, Electrical Engineering, 1989. Expertise and Research InterestsMy research interests include the integration of microelectromechanical (MEMS) elements with microelectronics processing in ways which minimize the impact of the MEMS processing on the standard microelectronic (CMOS, BiCMOS, etc.) process and device parameters. This research reflects the drive towards a more globally integrated microsystem technology that allows multiple MEMS technologies to be utilized in an integrated fashion. This effort has led to research to pursue ways to integrated post-CMOS technologies while maintaining the good MEMS materials properties required for applications such as accelerometers, other inertial sensors, pressure sensors, radio frequency (RF) resonating elements, and actuator structures like micromirrors, liquid and gas valves, pumps, etc. A related area of interest is the development of low temperature MEMS structural materials and localized annealing processes for integrated microsystem technologies. New and novel deposition and material processing may allow for good mechanical and electrical properties at temperatures compatible with post-CMOS integration. Recent areas of research activity include the development of nanoscaled processing and characterization for quantum dot based electronic devices, such as the single electron transistor. Effort to develop SET devices functional at room temperature has been demonstrated by my research group, utilizing beam based fabrication and nanoimprint based processing to demonstrate the functional characterization of thousands of SET devices at room temperature and below. The quantum dot and quantum wire based electronic development has led to several applications for biochemical and chemical sensing platforms. An additional area of significant research activity is in developing porous semiconductor materials for chemical, optical, and thermal microsystems. My research has demonstrated morphological control of macroporous silicon for chemical microsystems and is actively demonstrating electroosmotic pumping limits based on a highly ordered 20nm mesoporous silica membrane. Other ExpertiseMy expertise includes the development of wafer fabrication infrastructure in support of substrate processing for MEMS, microsystem, and optical microsystem technologies. My expertise also includes electronic CAD device design library definition, accelerometer, pressure sensor, thin film gas sensor, and CMOS device characterization, and standard cell layout. Industrial RelevanceThe development of microsystem technologies that decouple sensor or actuator processing from microelectronic processing supports further integration of technological functionality on chip versus multiple component configurations for system assembly whileminimizing process risk for integration. KeywordsCOS Keywords:Aerospace Engineering, Electrical Engineering or Electronics, Semiconductors.Additional Terms:Accelerometer, Biochemical Sensor, Electrochemical Sensor, Inertial Sensor, Mems, Micro Electro Mechanical Systems, Microsystems, Porous Silicon, Porous Titania, Pressure Sensor, Sensor, Single Electron Transistor, Water Quality Monitoring.Languages(Reading, Writing, Speaking)English: (Fluent, Fluent, Fluent) German: (Functional, Functional, Basic) MembershipsAmerican Society for Engineering Education Electrochemical Society Institute of Electrical and Electronics Engineers Honors and Awards1993-1996,
SRC Graduate Fellow,
Semiconductor Research Corporation,
University of Michigan,
Electrical Engineering, Solid-State Electronics
Previous Positions2000-2006, Assistant Professor,
Michigan Technological University,
College of Engineering,
Electrical and Computer Engineering
1996-2000, Principle Staff Engineer,
Motorola, Inc.,
Semiconductor Product Sector,
Sensor Products
1989-1990, Design Engineer,
Rosemount, Inc.,
Air Products,
Aerospace
PatentsMagnetic Annealing of Ferromagnetic Thin Films using Induction Heating,
Patent Number: 7193193,
2007,
Institution,
United States of America.
![]() Induction Heating of Thin Films,
Patent Number: 6878909,
2005,
Institution,
United States of America.
![]() Capacitively Sensed Micromachined Component and Method of Manufacturing,
Patent Number: 6544810,
2003,
Industry,
United States of America.
![]() Method of Manufacturing a Semiconductor Wafer Level Package,
Patent Number: 6465281,
2002,
Industry,
United States of America.
![]() Semiconductor Wafer Level Package,
Patent Number: 00961925.5-2203-US0025315,
2002,
Industry,
Germany.
Funding Received
Publications
Profile DetailsLast Updated: 2/24/2010 COS Expertise ID #327431 Reference this profile directly: http://myprofile.cos.com/bergpaul Individual Expertise profile of Paul L. Bergstrom, Copyright Paul L. Bergstrom. © COS ExpertiseTM, 2010, ProQuest LLC All rights reserved. |