Dr. Michael A. O'Keefe

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COS Expertise®
United States Department of Energy
Detailed to Office of Basic Energy Sciences
Materials Sciences and Engineering
Appointed: 2005
Lawrence Berkeley National Laboratory
on leave from National Center for Electron Microscopy
Materials Sciences
Staff Scientist III
Professional Headshot of Michael A. O'Keefe

Mailing Address

National Center for Electron Microscopy
Lawrence Berkeley National Laboratory
Building 72
1 Cyclotron Road
Berkeley, California 94720
United States

Contact Information

Phone: (510) 886-5527
Mobile: (510) 305-9769
sub-Angstrom@comcast.net
http://myprofile.cos.com/maokeefe

Qualifications

Ph.D., University of Melbourne, Diffraction Physics, 1975.
B.Sc., University of Melbourne, Solid State Physics, 1970.
Diploma, Royal Melbourne Institute of Technology, Applied Physics, 1965.

Expertise and Research Interests

Theory of electron image formation and interpretation in high-resolution transmission electron microscopy of materials. Theory and development of image simulation methods and auto-refinement methods. Materials structure determination and refinement below the nanoscale level by electron microscope image simulation and image processing. Theory and implementation of resolution extension by on-line microscope control and image processing. Development of on-line control for remote operation of electron microscopes and image acquisition.

Conceived and wrote seminal software for simulation of high-resolution electron microscope images (Nature, 1978) called SHRLI (Simulated High-Resolution Lattice Images). Created an interactive software suite for structure determination by comparison of experimental and simulated electron microscope images (Pfefferkorn, 1987) called TEMPaS (Transmission Electron Microscope Processing and Simulation).

Team member for successful atomic imaging in 3-D, including use of focal series of images to improve microscope resolution from 1.6Å to 1.38Å and reveal oxygen atoms in a silicate mineral for the first time (Downing et al., Nature, 1990).

Conceived, planned and implemented the one-Ångstrom microscope (OÅM) project to provide the National Center for Electron Microscopy with capability for sub-Ångstrom resolution using focal-series reconstruction of the specimen exit-surface electron wave in a CM300FEG/UT transmission electron microscope that I modified to extend its information limit from 1.07Å to 0.82Å (later, I improved electron-beam coherence and achieved 0.72Å).

First to demonstrate correction of three-fold astigmatism to allow sub-Å imaging. First person to demonstrate sub-Ångstrom resolution in a TEM -- showed carbon atoms in diamond at 0.89Å spacing using my OÅM in 1998.

Derived the alpha-null defocus condition and use it to demonstrate sub-0.8Å resolution in a TEM -- obtained world-record 0.78Å resolution from [112] Si with my OÅM in 2000.

Demonstrated the ability of sub-Ångstrom resolution to image lighter (smaller) atoms by producing the world's first (and so far only) TEM images of lithium atoms (the smallest metal atoms) in 2002.

As a member of the DOE TEAM project (Transmission Electron Achromatic Microscope), derived specifications for the microscope to achieve 0.5Å resolution and operate over an energy range from 80-300keV to minimize damage caused to sensitive specimens by the electron beam.

Helped develop the A-OK (Allard-O'Keefe) series of test specimens for verification and testing of sub-Ångstrom resolution in images from HR-(S)TEMs. Derived methods to measure resolution quality QRS and showed how to use QRS values to extract accurate atom positions from images obtained at sub-Rayleigh resolution with TEMs and STEMs.

I am an experienced and well-known electron microscopist and materials scientist. My publications in high-resolution electron microscopy and its application to materials (theoretical and experimental) have been cited over 2000 times. I have several "famous" publications in the field of high-resolution electron microscopy - "famous" is the SPIRES designation for publications with over 100 cites. My most-cited paper (128 cites) describes structure determination by comparison of experimental high-resolution electron microscope images with ones simulated from model structures. Another (121 cites) describes techniques for optimizing experimental high-resolution electron microscopy.

Other Expertise

Expert consultation on ultra-high-resolution electron microscope specifications, including site specifications and preparation

Future Research

3-D electron microscopy of non-periodic structures for 3-D structure determination.
Design of the TEAM (Transmission Electron Achromatic Microscope) for resolution of 0.5Å and automated reconstruction in 3-D
Methods of extraction of accurate atom positions from images at sub-Rayleigh resolution

Industrial Relevance

The tools I develop for structure determination have enabled materials science researchers to confirm many significant nanostructures in the fields of semiconductors, superconductors and super-alloys.

The interactive image simulation code, TEMPaS, which I designed and implemented for the National Center for Electron Microscopy, has become a successful commercial product under the name MacTempas.

The OÅM has been used by over 100 scientists working on projects that benefit from its unique sub-Å resolution.

Keywords

COS Keywords:

Applied Physics, Electron Microscopy, Image Processing, Materials Engineering, Materials Sciences, Physics, Solid State Physics.

Additional Terms:

A-OK, Aberration Correction, Atomic-Resolution, Rayleigh Resolution, Sparrow Resolution, Sub-Angstrom Resolution, Sub-Rayleigh Resolution, Super-Resolution.

Languages

(Reading, Writing, Speaking)

English (Australian): (Fluent, Fluent, Fluent)

Memberships

American Association for the Advancement of Science
Materials Research Society
Microscopy Society of America
The Minerals, Metals & Materials Society

Honors and Awards

2008, Journal cover for work at, United States Department of Energy (DOE), Lawrence Berkeley National Laboratory
2007, President of, Microscopy Society of America
2006, President-elect of, Microscopy Society of America
2004, Journal cover for work at, United States Department of Energy (DOE), Lawrence Berkeley National Laboratory
2003-2005, Director, Physical Sciences on governing council of, Microscopy Society of America
2000, Outstanding Performance Award, Materials Sciences Division, Lawrence Berkeley National Laboratory, Achievement of sub-Ångstrom resolution with my One-Ångstrom Microscope project in February 2000.
1997, Journal cover for work at, United States Department of Energy (DOE), Lawrence Berkeley National Laboratory
1996, Outstanding Performance Award, Materials Sciences Divison, Lawrence Berkeley National Laboratory, For leadership of the National Center for Electron Microscopy
1993, Outstanding Scientific Accomplishment, Department of Energy, Lawrence Berkeley National Laboratory, 3-D electron microscope imaging of metal and oxygen atoms
1978, Journal cover for work at, National Science Foundation (NSF), Arizona State University

Previous Positions

1995-1999, Deputy Head, National Center for Electron Microscopy, Materials Sciences
1994-1995, Acting Head, National Center for Electron Microscopy, Materials Sciences
1983-1994, Staff Scientist, National Center for Electron Microscopy, Materials Sciences
1979-1983, Senior Research Associate, University of Cambridge, Cavendish Laboratory, Physics
1976-1979, Postdoctoral, Arizona State University, College of Liberal Arts & Sciences, Center for Solid State Science, Electron Microscopy
1970-1975, Experimental Officer, Commonwealth Scientific and Industrial Research Organization (CSIRO), Tribophysics

Funding Received

  • United States Department of Energy (DOE): Transmission Electron Achromatic Microscope -- I led the effort, $25,000,000, 2004 to 2008.
  • United States Department of Energy (DOE): Materials Microcharacterization Collaboratory, $320,000, 1997 to 2001.
  • United States Department of Energy (DOE): Block funding for National Center for Electron Microscopy (increase from $1.8M), $2,200,000, 1994 to 1995.
  • United States Department of Energy (DOE): Proposal for a One-Ångstrom Microscope, $2,000,000, 1994 to 1996.
  • United States Department of Energy (DOE): Award of equipment money for Outstanding Research, $50,000, 1993 to .
  • United States Department of Energy (DOE): Computer Lab for TEM Image Processing, Simulation and Analysis, $320,000, 1983 to 1986.

Publications

  • Michael A. O'Keefe (2008) Seeing Atoms with Aberration-Corrected Sub-Ångström Electron Microscopy, Ultramicroscopy, 108 (3), 196-209
  • Douglas A. Blom, Lawrence F. Allard, Satoshi Mishina, Michael A. O'Keefe (2006) Early Results from an Aberration-Corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory, Microscopy and Microanalysis, 12 (6), 483-491
  • Michael A. O'Keefe, Lawrence F. Allard, Stephen J. Pennycook, Douglas A. Blom (2006) Transcending the One-Ångström Atomic-Resolution Barrier in the TEM, Microscopy & Microanalysis, 12, 162-163
  • Michael A. O’Keefe, Lawrence F. Allard, Douglas A. Blom, HRTEM Imaging of Atoms At Sub-Ångström Resolution, Journal of Electron Microscopy, On-Line Access, Oxford, OUP [DOI 10.1093/jmicro/dfi036], 25 Aug 2005
  • Michael A. O'Keefe, Lawrence F. Allard, Douglas A. Blom (2005) HRTEM Imaging of Atoms at Sub-Ångström Resolution, J. Electron Microscopy, 54, 169-180.
  • M.A. O'Keefe, Yang Shao-Horn (2005) Imaging Lithium Atoms at Sub-Ångstrom Resolution, nanoSolutions, 1 (1), 36-53
  • L.F. Allard, D.A. Blom, M.A. O'Keefe, C. Kiely, M. Kaneyama, T. Saweda, First Results from the Aberration-Corrected JEOL 2200FS-AC STEM/TEM, Microscopy & Microanalysis, 10, 234-235, 2004
  • Michael A. O'Keefe, Sub-Angstrom Resolution with Aberration-Corrected TEM: Present and Future, Proc. 1st Aberration-Corrected MSA Meeting, 10, 12-13, 1 August 2004
  • Michael A. O'Keefe, Image Formation in the High-Resolution Transmission Electron Microscope, Microscopy & Microanalysis, 10(4), 397-400, 2004
  • Michael A. O'Keefe, Crispin J.D. Hetherington, E. Chris Nelson, Sub-Ångstrom Resolution with a Mid-Voltage TEM, Microscopy Today, 12(3), 28-29, 24 May 2004
  • Michael A. O'Keefe, John H. Turner, John A. Musante, Crispin J.D. Hetherington, A.G. Cullis, Bridget Carragher, Ron Jenkins, Julie Milgrim, Ronald A. Milligan, Clinton S. Potter, Lawrence F. Allard, Douglas A. Blom, Lynn Degenhardt, William H. Sides, Laboratory Design for High-Performance Electron Microscopy, Microscopy Today, 12(3), 8-14, 24 May 2004
  • Z. Liliental-Weber, T. Tomaszewicz, D. Zakharov, J. Jasinski, M.A. O'Keefe (2004) Atomic Structure of Defects in GaN:Mg Grown with Ga Polarity, Phys. Rev. Letts., 93, 1-4.
  • Michael A. O'Keefe, Yang Shao-Horn (2004) Sub-Ångstrom Atomic-Resolution Imaging from Heavy Atoms to Light Atoms, Microscopy & Microanalysis, 10, 86-95
  • Z. Liliental-Weber, T. Tomaszewicz, D. Zakharov, J. Jasinski, M.A. O'Keefe, S. Hautakangas, A. Laakso, K. Saarinen, Atomic Structure of Defects in GaN:Mg grown with Ga polarity, Mat. Res. Soc. Symp. Proc. 798, Y9.7.1, 2004
  • Michael A. O'Keefe, Lawrence F. Allard, Sub-Ångstrom Electron Microscopy for Sub-Ångstrom Nano-Metrology, Proceedings of National Nanotechnology Initiative Grand Challenge Workshop on Instrumentation and Metrology for Nanotechnology, 52-53, 27 Jan 2004
  • Michael A. O'Keefe, Yang Shao-Horn, Sub-Ångstrom Atomic-Resolution Imaging from Heavy Atoms to Light Atoms, Microscopy & Microanalysis, 10(1), 86-95, 2004
  • Z. Liliental-Weber, D. Zakharov, J. Jasinski, M.A. O'Keefe, H. Morkoc, Screw Dislocations in GaN Grown by Different Methods, Microscopy & Microanalysis, 10(1), 47-54, 2004
  • Yang Shao-Horn, Laurence Croguennec, Claude Delmas, E. Chris Nelson, Michael A. O'Keefe, Atomic resolution of lithium ions in LiCoO2, Nature Materials, 2(7), 464-467, 1 Jul 2003
  • Michael A. O'Keefe, Yang Shao-Horn, Seeing Lithium Atoms by Sub-Ångstrom High-Resolution Electron Microscopy, Microscopy & Microanalysis, 9(2), 268-269, 2003
  • Michael A. O'Keefe, E. Chris Nelson, Lawrence F. Allard, Focal-Series Reconstruction of Nanoparticle Exit-Surface Electron Wave, Microscopy & Microanalysis, 9(2), 278-279, 2003
  • Michael A. O'Keefe, HRTEM at Half-Ångstrom Resolution: from OÅM to TEAM, Microscopy & Microanalysis, 9(2), 936-937, 2003
  • S.T. Taylor, R. Gronsky, J. Mardinly, M.A. O'Keefe, HRTEM image simulations for the study of ultra-thin gate oxides, Microscopy & Microanalysis, 8, 412-421, 2002
  • Jianwei Miao, Tetsu Ohsuna, Osamu Terasaki, Keith O. Hodgson, Michael A. O'Keefe, Atomic resolution three-dimensional electron diffraction microscopy, Phys. Rev. Letts, 89(15), 155502, 2002
  • Z. Liliental-Weber, J. Jasinski, J. Washburn, M.A. O'Keefe, Screw Dislocations in GaN, Microscopy and Microanalysis, 8(2), 1198-1199, 2002
  • Michael A. O'Keefe, Peter C. Tiemeijer, Maxim V. Sidorov, Estimation of the Electron Beam Energy Spread for TEM Information Limit, Microscopy and Microanalysis, 8(2), 480-481, 2002
  • M.A. O'Keefe, E.C. Nelson, Y.C. Wang, A. Thust, Sub-Ångstrom resolution of atomistic structures below 0.8Å, Philosophical Magazine, B 81(11), 1861-1878, November 2001
  • Michael A. O'Keefe, Alpha-null defocus: An optimum defocus condition with relevance for focal-series reconstruction, 59th Ann. Proc. MSA, Long Beach, California, 898-899, 2001
  • M.A. O'Keefe, E.C. Nelson, J.H. Turner, A. Thust, Sub-Ångstrom transmission electron microscopy at 300keV, 59th Ann. Proc. MSA, Long Beach, California, 916-917, 2001
  • M.A. O'Keefe, C.J.D. Hetherington, Y.C. Wang, E.C. Nelson, J.H. Turner, C. Kisielowski, J.-O. Malm, R. Mueller, J. Ringnalda, M. Pan, A. Thust, Sub-Ångstrom High-Resolution Transmission Electron Microscopy at 300keV, Ultramicroscopy, 89(4), 215-241, 2001
  • M.A. O'Keefe, E.C. Nelson, U. Dahmen, Sub-Ångstrom Transmission Electron Microscopy for Materials Science, Proceedings of International Ninth Beijing Conference and Exhibition on Instrumental Analysis, China-USA Joint Symposium on the Frontiers of Electron Microscopy in Materials Science, Beijing, China, A81-A82, 2001
  • M.A. O'Keefe, The optimum Cs condition for high-resolution transmission electron microscopy, 58th Ann. Proc. MSA, Philadelphia, Pennsylvania, 1036-1037, 2000
  • M. A. O'Keefe, The NCEM One-Ångstrom Microscope project reaches 0.89Å resolution, 58th Ann. Proc. MSA, 1192-1193, 2000
  • S.T. Taylor, R. Gronsky, J. Mardinly, M. A. O'Keefe, HRTEM image simulations for gate oxide metrology, 58th Ann. Proc. MSA, 1080-1081, 2000
  • S.T. Taylor, R. Gronsky, J. Mardinly, M. A. O'Keefe, HRTEM image simulations of structural defects in gate oxides, 58th Ann. Proc. MSA, 1078-1079, 2000
  • Michael A. O'Keefe, Push TEM limits with super-resolution, R&D Magazine, 79, October 1999
  • Michael A. O'Keefe, John R. Taylor, OLIS: On-Line Image Simulation and structure characterization for the Materials Microcharacterization Collaboratory, 57th Ann. Proc. MSA, Portland, Oregon, 14-15, 1999
  • Y.C. Wang, A. Fitzgerald, E.C. Nelson, C. Song, M.A. O'Keefe, C. Kisielowski, Effect of correction of the 3-fold astigmatism on HREM lattice imaging with information below 100 pm, 57th Ann. Proc. MSA, Portland, Oregon, 822-823, 1999
  • B. Parvin, J. Taylor, G. Cong, M.A. O'Keefe, M. Barcellos-Hoff, DeepView: A Channel for Distributed Microscopy and Informatics, 1999
  • Michael A. O'Keefe, High resolution transmission electron microscopy for zero Cs, Proc. XIVth Int. Congress for Electron Microscopy, I, 163-164, 1998
  • Jan-Olle Malm, Michael A. O'Keefe, Deceptive 'lattice spacings' in high-resolution micrographs of metal nanoparticles, Ultramicroscopy, 68(1), 13-23, 15 May 1997
  • John H. Turner, Michael A. O'Keefe, Robert Mueller, Design and implementation of a site for a one-Ångstrom TEM, 55th Ann. Proc. MSA, Cleveland, Ohio, 1177-1178, 1997
  • Romano LT, Northrup JE, O'Keefe MA, Inversion Domains in GaN Grown on Sapphire, Applied Physics Letters, 69(16), 2394-2396, 14 Oct 1996
  • Ponce FA, O'Keefe MA, Nelson EC, Transmission Electron Microscopy of the AlN-SiC Interface, 74(3), 777-789, September 1996
  • Parvin B, Taylor J, Crowley B, Wu L, Johnston W, Owen D, O'Keefe M A, Dahmen U, Telepresence for in-situ microscopy, International Conference on Multimedia Computing and Systems -Proceedings, 481-487, 17 Jun 1996
  • V. Radmilovic, R. Kilaas, M.A. O'Keefe, Application of cross-correlation technique for the analysis of Fresnel effect in small particle HREM imaging, Proc. European. Congress for Electron Microscopy, II, 50-51, 1996
  • T. Epicier, M.A. O'Keefe, HRTEM and TEM simulations on a personal computer with SIMPLY-S, Proc. European Congress for Electron Microscopy, I, 410-411, 1996
  • F.M. Ross, K.M. Krishnan, N. Thangaraj, R.F.C. Farrow, R.F. Marks, A. Cebollada, S.S.P. Parkin, M.F. Toney, M. Huffman, C.A. Paz de Araujo, L.D. McMillan, J. Cuchiaro, M.C. Scott, C.Echer, F.A. Ponce, M.A. O'Keefe, E.C. Nelson, Applications of electron microscopy in collaborative industrial research, Materials Research Bulletin, 21, 17-23, 1996
  • B. Parvin, D. Agarwal, D. Owen, M.A. O'Keefe, K.H. Westmacott, U. Dahmen, R. Gronsky, A project for on-line remote control of a high-voltage TEM, 53rd Ann. Proc. MSA, Kansas, 82-83, 1995
  • Velimir Radmilovic, Michael A. O'Keefe, Fresnel effect in high resolution TEM imaging of small particles, 53rd Ann Proc. MSA Kansas City, Missouri, 564-565, 1995
  • Michael A. O'Keefe, Where are the limits to spatial resolution in the HRTEM?, 53rd Ann Proc. MSA Kansas City, Missouri, 280-281, 1995
  • Michael A. O'Keefe, Advances in image simulation for high resolution TEM, in 53rd Ann. Proc. MSA, Kansas City, Missouri, 38-39, 1995
  • F.A. Ponce, M.A. O'Keefe, E.C. Nelson, Transmission electron microscopy of the AlN/SiC interface, Phil. Mag. A, 74, 777-789, 1995
  • Michael A. O'Keefe, Velimir Radmilovic, Specimen thickness is wrong in simulated HRTEM images, Proc. XIIth Int. Congress for Electron Microscopy, 1, 361 -362, 1994
  • M.A. O'Keefe, K.H. Downing, H.-R. Wenk, Hu Meisheng, 3-D imaging of crystals at atomic resolution, Materials Research Society Symposium Proceedings, 332, 563-571, 1994
  • Kenneth H. Downing, Michael A. O'Keefe, Hans-Rudolph Wenk, Oxygen contrast in ionic structures: 3D electron crystallography of YBCO, Proc. XIIth Int. Congress for Electron Microscopy, 1, 475-476, 1994
  • L.T. Romano, R.D Bringans, J. Knall, D.K. Biegelsen, Alberto Garcia, John E. Northrup, M.A. O'Keefe, Atomic rearrangement at the interface of annealed ZnSe films grown on vicinal Si(001) substrates, Phys. Rev. B, 50, 4416-4423, 1994
  • Wayne E. King, Michael A. OKeefe, Geoffrey H. Campbell, Quantitative HREM using non-linear least-squares methods, 52nd Ann. Proc. MSA, 716-717, 1994
  • Michael A. O'Keefe, Interpretation of HRTEM images by computer simulation: an introduction to theory and practice, 52nd Ann. Proc. MSA, 394-395, 1994
  • W. Dong, T. Baird, J.R. Fryer, C.J. Gilmore, D.D. MacNicol, G. Bricogne, D.J. Smith, M.A. O'Keefe, S. Hovmöller, Electron microscopy at 1Å resolution by entropy maximization and likelihood ranking, Nature, 355, 605-609, 1992
  • H.-R. Wenk, K.H. Downing, Hu Meisheng, M.A. O'Keefe, 3D Structure Determination from Electron-Microscope Images: Electron Crystallography of Staurolite, Acta Crystallographica, A48, 700-716, 1992
  • P.J. Brown, A.G. Fox, E.N. Maslen, M.A. O'Keefe, T.M. Sabine, B.T.M. Willis, ed. A.J.C. Wilson, Interpretation of Diffracted Intensities, International Tables for Crystallography, Chapt.6, C, 476-533, 1992
  • Michael A. O'Keefe, Roar Kilaas, Comments on 'HRTEM-Bildkontrastsimulation von Strukturen mit Punktdefekten in Speziellen Lagen', Zeitschrift für Kristallographie, 194, 125-128, 1991
  • Kenneth H. Downing, Hu Meisheng, Hans-Rudolf Wenk, Michael A. O'Keefe, Resolution of Oxygen Atoms in Staurolite by Three-Dimensional Transmission Electron Microscopy, Nature, 348, 525-528, 1990
  • T. Epicier, M.A. O'Keefe, G. Thomas, Atomic Imaging of 3:2 mullite, Acta Crystallographica, A46, 948-962, 1990
  • U. Dahmen, C.J.D. Hetherington, M.A. O'Keefe, K.H Westmacott, M.J. Mills, M.S. Daw, V. Vitek, Atomic structure of a Sigma99 grain boundary in aluminum: a comparison between atomic-resolution observation, pair-potential and embedded-atom simulations, Phil. Mag. Letts., 62, 327-335, 1990
  • Z. Liliental-Weber, M.A. O'Keefe, The atomic arrangement at Cr/GaAs (110) interfaces, Journal of Vacuum Science and Technology B, 7, 1022-1026, 1989
  • Z. Liliental-Weber, M.A. O'Keefe, J. Washburn, Inversion boundaries in GaAs grown on Si, Ultramicroscopy, 30, 20-26, 1989
  • A.G. Fox, M.A. O'Keefe, M.A. Tabbernor, Relativistic Hartree-Fock X-ray and electron atomic scattering factors at high angles, Acta Crystallographica, A45, 786-793, 1989
  • R. Kilaas, M.A. O'Keefe, K.M. Krishnan, On the inclusion of upper-Laue-layers in computational methods in high-resolution electron microscopy, Ultramicroscopy, 21, 47-62, 1987
  • Michael A. O'Keefe, Roar Kilaas, Advances in high-resolution image simulation, 6th Pfefferkorn Conf. on Image and Signal Processing, 2, 225-244, 1987
  • David J. Smith, R.A Camps, L.A. Freeman, M.A. O'Keefe, W.O. Saxton, G.J. Wood, Approaching atomic-resolution electron microscopy, Ultramicroscopy, 18, 63-76, 1985
  • W.O. Saxton, M.A. O'Keefe, D.J.H. Cockayne, M. Wilkins, Sign conventions in electron diffraction and imaging: Addendum, Ultramicroscopy, 13, 349-350, 1984
  • M.A. O'Keefe, Electron image simulation; a complementary processing technique, Proc. 3rd Pfefferkorn Conf. on Electron Optical Systems, 209-220, 1984
  • P.G. Self, M.A. O'Keefe, P.R. Buseck, A.E.C. Spargo, Practical computation of amplitudes and phases in electron diffraction, Ultramicroscopy, 11, 35-52, 1983
  • D.J. Smith, W.O. Saxton, M.A. O'Keefe, G.J. Wood, W.M. Stobbs, The importance of beam alignment and crystal tilt in high resolution electron microscopy, Ultramicroscopy, 11, 263-282, 1983
  • M.A. O'Keefe, J.R. Fryer, D.J. Smith, High resolution electron microscopy of molecular crystals, II. Image simulation, Acta Crystallographica, A39, 838-847, 1983
  • W.O. Saxton, M.A. O'Keefe, D.J.H. Cockayne, M. Wilkins, Sign conventions in electron diffraction and imaging, Ultramicroscopy, 12, 75-78, 1983
  • M.A. O'Keefe, Resolution-damping functions in non-linear images, 37th Ann. Proc. EMSA, 556-557, 1979
  • M.A. O'Keefe, P.R. Buseck, S. Iijima, Computed Crystal Structure Images for High Resolution Electron Microscopy, Nature, 274, 322-324, 1978

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