Mr. Owen P. Mills

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Michigan Technological University
College of Engineering
Materials Science & Engineering
Electron Optics EngineerAppointed: 1995
Michigan Technological University
College of Engineering
Geology
Graduate Student
Professional Headshot of Owen P. Mills

Mailing Address

Michigan Technological University
Materials Science & Engineering
Rm. 512 M&M Bldg.
Houghton, Michigan 49931-1295
United States

Contact Information

Phone: (906) 369-1875
Fax: (906) 487-2934
opmills@mtu.edu
http://www.mse.mtu.edu/~opmills/

Qualifications

A.A., Delgado College, Electrical Engineering Technology, 1990.
B.S., Louisiana State University, Petroleum Land Management, 1985.

Expertise and Research Interests

I am interested and experienced in the operation and management of multi-user instrumentation facilities. My expertise includes auditable lab cost and use accounting for multi-user facilities. Of note is the form I developed for calculating the hourly rate for instrument use that is now being used campus-wide by MTU Accounting.

Key to my vision of multi-user instrumentation facility management is the inclusion of maintenance and repair of the equipment, as well as education/ training of the users.

I have course work and short course training in the application, training for, maintenance, and repair of the following equipment:
Electron Optical Instrumentation including SEM (UNO, 93) & (Lehigh, 1990), FESEM (Hitachi, 2004), TEM (MTU, 1996).
Energy Dispersive X-ray Equipment including Microanalysis and ED-XRF.
Wave Dispersive X-ray Equipment including Microprobe (UNO, 1993) and XRF (ACS, 1992).
Ion Beam Equipment including Ion Mills and FIB (Hitachi, 2004).
General Vacuum including Mechanical pumps, Diffusion pumps, Turbo pumps, Cryo pumps.
Support and ancillary sample preparation equipment for all the above.

Keywords

COS Keywords:

Electrical Engineering Or Electronics, Electro-Optical Technology, Electro-Optics, Engineering Technology, Geology, Land Management Or Land Use, Materials Engineering, Materials Sciences, Microscopy, Vacuum Engineering, Vacuum Science.

Memberships

Microbeam Analysis Society
Microscopy Society of America

Honors and Awards

1995-1997, Chairman, Traveling Book Exhibit, Microscopy Society of America
1994 Annual Meeting Treasurer, Microscopy Society of America

Previous Positions

1992-1995, Assistant Director, Tulane University, Coordinated Instrumentation Facility
1990-1992, Manager, Tulane University, Coordinated Instrumentation Facility, Inorganic Laboratory
1986-1990, Supervisor, Tulane University, Arts & Sciences, Geology, Geological Lab

Funding Received

  • Century II Campaign Endowed Equipment Fund: Proposal for Purchase of ACMAL Sputter Coater, $3,583.33, 2004 to 2004.
  • Research Excellence Fund (State of Michigan): Intergrated Digital MIcroscopy and Microanalysis at MTU, $99,164, 1996 to 1997.
  • Michigan Space Grant Consortium: Accurate Shape Measurements of Fine Volcanic Ash Particles, $5,000, 1996 to 1997.
  • DE-FG09-94SR18398: Automated ARL SEMQ Electron Microanalyzer, $10,000, 1993 to 1994.

Publications

  • Ken Heng See, Michael E. Mullins, Owen P. Mills, Patricia A. Heiden, A Reactive Core-Shell Nanoparticle Approach to Prepare Hybrid Nanocomposites: Effects of Processing Variables, Nanotechnology, 16, 1950-1959, Jul 2005
  • Mills, O.P., New Resin for Repair of Bell Jar Chips, Microscopy Today, 13(2), 46, Mar 2005
  • Mills, O.P., Water Recirculator Maintenance, Microscopy Today, 11(3), 43, 2003
  • Robinson, G.W., Jasczcak, J.A., Wegner,, Manganotantalite From the Alto Do Giz Area, Equador, Rio Grande Do Norte, Brazil, The Mineralogical Record, 33(6), 505-521, 2002
  • Iyer, S.D., Gupta, S.M., Charan, S.N., M, Volcanogenic-hydrothermal Iron-rich Materials From the Southern Part of the Central Indian Ocean Basin, Marine Geology, 158, 15-25, 1999
  • Xu, J., Wu, H, Mills, O.P., Heiden, P.A., A Morphological Investigation of Thermosets Toughened With Novel Thermoplastics. I. Bismaleimide Modified With Hyperbranched Polyester, Journal of Applied Polymer Science, 72, 1065-1076, 1999
  • Mills, O.P., Is Your Lab Safe, Scanning, 20, 152-153, 1998
  • Mills, O.P., Reducing Service Contract Costs and Do-It-Yourself EM Maintenance, Microscopy Today, 10, 8-9, 1997
  • atallo, W., Henk, W., Younger, L., Mills, Trace Metal Uptake By Pichia Spartinae, An Endosymbiotic Yeast in the Salt Marsh Cord Grass Spartina Alterniaflora, Chemistry and Ecology, 13, 113-131, 1996
  • Koplitz, L., Urbanik, J., Harris, S., Mi, Determining Lead in Sediments By X-ray Fluorescence and the Method of Standard Additions, Enriron. Sci. Technol., 28, 538-540, 1994
  • Latimer, S., Mills, O., Nielson, A., New Ultra-thin Moxtek Window Improves Light Element Detection, American Environmental Laboratory, 6, 23, 1994
  • Zablotsky, M., Meffert, R., Mills, O., B, The Macroscopic, Microscopic and Spectrometric Effects of Various Chemotherapeutic Agents on the Plasma-sprayed Hydroxyapatite-coated Implant Surface, Clinical Oral Implant Research, 3, 189-198, 1992

Profile Details

Last Updated: 8/2/2005

COS Expertise ID #326486
Reference this profile directly: http://myprofile.cos.com/opmills